In-house wafer testing service is available from WIN for both HBT and HEMT products. The service provides standard WAT database for all customers, and offers PCM database for SPC analysis in parallel. The real time yield report generated by CIM system automatically judges if processed wafer has met shipping criteria.
WIN also provides probe card making service and offers on-wafer DC/RF screening depending on specific request. The proprietary design of our probe card offers the best quality to meet customers' requirements. The available DC/RF screening service so far includes:
- DC single and multiple site parallel probing. (Max is hex-site X16)
- High current (1A) measurement
- Insertion loss and Harmonic testing
- 4 Ports Vector S-parameters testing : Single-ended / Differential
- Fixed or Sweep RF power testing : Gain, P1dB, Psat, etc.
- RF high input power testing : > +10 dBm
- CW / Pulse testing
- Other testing