Testing Service
In-house wafer testing service is available from WIN for both HBT and HEMT products. The service provides standard WAT database for all customers, and offers PCM database for SPC analysis in parallel. The real time yield report generated by CIM system automatically judges if processed wafer has met shipping criteria.

WIN also provides probe card making service and offers on-wafer DC/RF screening depending on specific request. The proprietary design of probe card can perform best quality in low cost to meet customers' requirements. The available DC/RF screening service so far includes:

  1. DC testing: Multi-channels functional testing
  2. GSM/WLAN switch RF testing: Insertion loss and Harmonic testing
  3. Small signal S-parameter testing: Vector S-parameters, up to 40GHz 
  4. Ka band RF power testing: Gain, P1dB

Pulse mode RF power test

Frequency Pulse Width Duty Cycle Max provided input power Max measured output power Max Pulse voltage Max Pulse current (total) No. of pulse channels No. of CW channels
(100mA/20v)
3.1~3.5GHz 7.5μ 5% 22 dBm 45 dBm 8V 6A 4 5
13.75~14.5GHz 15μ 15% 14 dBm 36 dBm 8V6A45
29.5~30GHz15μ15%16 dBm36 dBm8V6A4 5

Customer requires testing service can download the OPTR form here. Please fill out and submit it to our sales or engineering window. Our team will evaluate your request and feedback with more details.

 
   
   
   
   
 
   
   
   
WIN
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