WIN also provides probe card making service and offers on-wafer DC/RF screening depending on specific request. The proprietary design of probe card can perform best quality in low cost to meet customers' requirements. The available DC/RF screening service so far includes:
- DC testing: Multi-channels functional testing
- GSM/WLAN switch RF testing: Insertion loss and Harmonic testing
- Small signal S-parameter testing: Vector S-parameters, up to 40GHz
- Ka band RF power testing: Gain, P1dB
Pulse mode RF power test| Frequency | Pulse Width | Duty Cycle | Max provided input power | Max measured output power | Max Pulse voltage | Max Pulse current (total) |
No. of pulse channels | No. of CW channels (100mA/20v) |
| 3.1~3.5GHz | 7.5us | 5% | 22 dBm | 45 dBm | 8V | 6A | 4 | 5 |
| 13.75~14.5GHz | 15us | 15% | 14 dBm | 36 dBm | 8V | 6A | 4 | 5 |
| 29.5~30GHz | 15us | 15% | 16 dBm | 36 dBm | 8V | 6A | 4 | 5 |
Customer who needs the testing service is welcome to download the OPTR (On-wafer Probe Testing Request ) form first, and then fill out and submit to WIN through your contact sells or our customer service group. A cross function team will act with customer to settle down the test plan and delivery schedule.
