測試服務

In-house wafer testing service is available from WIN for both HBT and HEMT products. The service provides standard WAT database for all customers, and offers PCM database for SPC analysis in parallel. The real time yield report generated from CIM system automatically for shipping judgment.

WIN also provides probe card making service and offers on-wafer DC/RF screening depending on specific request. The proprietary design of probe card can perform best quality in low cost to meet customers’ requirements. The available DC/RF screening service so far including:

	DC testing
	Multi-channels functional testing
	GSM/WLAN switch RF testing
	Insertion loss and Harmonic testing
	Small signal S-parameter testing
	Vector S-parameters, up to 40GHz
	Ka band RF power testing
	Gain, P1dB

Customer who needs the testing service is welcome to download the OPTR (On-wafer Probe Testing Request) form first, and then fill out and submit to WIN through your contact sells or our customer service group. A cross function team will act with customer to settle down the test plan and delivery schedule.